Novel solutions for suppressing parasitic turn-on behaviour on lateral vertical JFETs
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: 2014DOI: 10.1109/IWESEP.2014.11
Keyword(s): data mining,semantic networks,software quality,F-measure score,MCR comments,MCR discussion usefulness,OSS projects,code quality,code review tool,comment usefulness assessment,cost effectiveness,mailing list,modern code review,semantic similarity,software quality,Data models,Manuals,Semantics,Software quality,Standards,Training,Training data,Modern Code Review,Software Quality,Text Mining
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Novel solutions for suppressing parasitic turn-on behaviour on lateral vertical JFETs
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| date accessioned | 2020-03-12T20:52:29Z | |
| date available | 2020-03-12T20:52:29Z | |
| date issued | 2014 | |
| identifier other | 6910760.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1028679?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Novel solutions for suppressing parasitic turn-on behaviour on lateral vertical JFETs | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8153880 | |
| subject keywords | data mining | |
| subject keywords | semantic networks | |
| subject keywords | software quality | |
| subject keywords | F-measure score | |
| subject keywords | MCR comments | |
| subject keywords | MCR discussion usefulness | |
| subject keywords | OSS projects | |
| subject keywords | code quality | |
| subject keywords | code review tool | |
| subject keywords | comment usefulness assessment | |
| subject keywords | cost effectiveness | |
| subject keywords | mailing list | |
| subject keywords | modern code review | |
| subject keywords | semantic similarity | |
| subject keywords | software quality | |
| subject keywords | Data models | |
| subject keywords | Manuals | |
| subject keywords | Semantics | |
| subject keywords | Software quality | |
| subject keywords | Standards | |
| subject keywords | Training | |
| subject keywords | Training data | |
| subject keywords | Modern Code Review | |
| subject keywords | Software Quality | |
| subject keywords | Text Mining | |
| identifier doi | 10.1109/IWESEP.2014.11 | |
| journal title | ower Electronics and Applications (EPE'14-ECCE Europe), 2014 16th European Conference on | |
| filesize | 496910 | |
| citations | 0 | |
| contributor rawauthor | Velander, E. , Lofgren, A. , Kretschmar, K. , Nee, H.-P. |