Translation between English and Mauritian Creole: A statistical machine translation approach
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سال
: 2014شناسه الکترونیک: 10.1109/ESSDERC.2014.6948798
کلیدواژه(گان): CMOS integrated circuits,MOSFET,semiconductor device measurement,silicon-on-insulator,statistical analysis,FD-SOI technology,MOSFET operation,RTS fluctuations,drain current characteristics,dynamic variability,low frequency noise,ramp gate voltage,reciprocal square root,size 28 nm,static mismatch contribution,static variability sources,statistical analysis,sweep-to-sweep dispersion,CMOS integrated circuits,Current measurement,Logic gates,Low-frequency noise,MOSFET,Standards
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آمار بازدید
Translation between English and Mauritian Creole: A statistical machine translation approach
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| contributor author | Sukhoo, A. , Bhattacharyya, P. , Soobron, M. | |
| date accessioned | 2020-03-12T20:37:57Z | |
| date available | 2020-03-12T20:37:57Z | |
| date issued | 2014 | |
| identifier other | 6880635.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1020203 | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | Translation between English and Mauritian Creole: A statistical machine translation approach | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8144662 | |
| subject keywords | CMOS integrated circuits | |
| subject keywords | MOSFET | |
| subject keywords | semiconductor device measurement | |
| subject keywords | silicon-on-insulator | |
| subject keywords | statistical analysis | |
| subject keywords | FD-SOI technology | |
| subject keywords | MOSFET operation | |
| subject keywords | RTS fluctuations | |
| subject keywords | drain current characteristics | |
| subject keywords | dynamic variability | |
| subject keywords | low frequency noise | |
| subject keywords | ramp gate voltage | |
| subject keywords | reciprocal square root | |
| subject keywords | size 28 nm | |
| subject keywords | static mismatch contribution | |
| subject keywords | static variability sources | |
| subject keywords | statistical analysis | |
| subject keywords | sweep-to-sweep dispersion | |
| subject keywords | CMOS integrated circuits | |
| subject keywords | Current measurement | |
| subject keywords | Logic gates | |
| subject keywords | Low-frequency noise | |
| subject keywords | MOSFET | |
| subject keywords | Standards | |
| identifier doi | 10.1109/ESSDERC.2014.6948798 | |
| journal title | ST-Africa Conference Proceedings, 2014 | |
| filesize | 221826 | |
| citations | 0 |