contributor author | Yanovsky, I. , Tanner, A. , Lambrigtsen, B. | |
date accessioned | 2020-03-12T20:36:58Z | |
date available | 2020-03-12T20:36:58Z | |
date issued | 2014 | |
identifier other | 6878929.pdf | |
identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1019782?show=full | |
format | general | |
language | English | |
publisher | IEEE | |
title | Efficient deconvolution and spatial resolution enhancement from continuous and oversampled observations in microwave imagery | |
type | Conference Paper | |
contenttype | Metadata Only | |
identifier padid | 8144171 | |
subject keywords | Calibration | |
subject keywords | Dielectric measurement | |
subject keywords | Dielectrics | |
subject keywords | Europe | |
subject keywords | Fasteners | |
subject keywords | Sockets | |
subject keywords | Substrates | |
subject keywords | Calibration | |
subject keywords | de-embedding | |
subject keywords | indirect-contact measurement | |
subject keywords | via array | |
identifier doi | 10.1109/EDAPS.2014.7030805 | |
journal title | icrowave Radiometry and Remote Sensing of the Environment (MicroRad), 2014 13th Specialist Meeting o | |
filesize | 1185801 | |
citations | 0 | |