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contributor authorYanovsky, I. , Tanner, A. , Lambrigtsen, B.
date accessioned2020-03-12T20:36:58Z
date available2020-03-12T20:36:58Z
date issued2014
identifier other6878929.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1019782?show=full
formatgeneral
languageEnglish
publisherIEEE
titleEfficient deconvolution and spatial resolution enhancement from continuous and oversampled observations in microwave imagery
typeConference Paper
contenttypeMetadata Only
identifier padid8144171
subject keywordsCalibration
subject keywordsDielectric measurement
subject keywordsDielectrics
subject keywordsEurope
subject keywordsFasteners
subject keywordsSockets
subject keywordsSubstrates
subject keywordsCalibration
subject keywordsde-embedding
subject keywordsindirect-contact measurement
subject keywordsvia array
identifier doi10.1109/EDAPS.2014.7030805
journal titleicrowave Radiometry and Remote Sensing of the Environment (MicroRad), 2014 13th Specialist Meeting o
filesize1185801
citations0


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