High voltage-gain interleaved boost DC-DC converter discarded electrolytic capacitor
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Year
: 2014DOI: 10.1109/PVSC.2014.6925246
Keyword(s): X-ray diffraction,X-ray fluorescence analysis,copper compounds,gallium compounds,indium compounds,solar cells,vacuum deposition,&,#x03B1,-Mo back contact layer,CIGS deposition,Cu(GaIn)Se<,sub>,2<,/sub>,Rietveld whole-pattern refinement method,X-ray diffraction analysis,X-ray fluorescence measurements,copper indium gallium diselenide photovoltaic materials,lattice parameter,process conditions,quantitative structural information extraction,relative site occupancies,si
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High voltage-gain interleaved boost DC-DC converter discarded electrolytic capacitor
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| date accessioned | 2020-03-12T20:26:20Z | |
| date available | 2020-03-12T20:26:20Z | |
| date issued | 2014 | |
| identifier other | 6870061.pdf | |
| identifier uri | http://libsearch.um.ac.ir:80/fum/handle/fum/1014553?locale-attribute=en | |
| format | general | |
| language | English | |
| publisher | IEEE | |
| title | High voltage-gain interleaved boost DC-DC converter discarded electrolytic capacitor | |
| type | Conference Paper | |
| contenttype | Metadata Only | |
| identifier padid | 8137990 | |
| subject keywords | X-ray diffraction | |
| subject keywords | X-ray fluorescence analysis | |
| subject keywords | copper compounds | |
| subject keywords | gallium compounds | |
| subject keywords | indium compounds | |
| subject keywords | solar cells | |
| subject keywords | vacuum deposition | |
| subject keywords | & | |
| subject keywords | #x03B1 | |
| subject keywords | -Mo back contact layer | |
| subject keywords | CIGS deposition | |
| subject keywords | Cu(GaIn)Se< | |
| subject keywords | sub> | |
| subject keywords | 2< | |
| subject keywords | /sub> | |
| subject keywords | Rietveld whole-pattern refinement method | |
| subject keywords | X-ray diffraction analysis | |
| subject keywords | X-ray fluorescence measurements | |
| subject keywords | copper indium gallium diselenide photovoltaic materials | |
| subject keywords | lattice parameter | |
| subject keywords | process conditions | |
| subject keywords | quantitative structural information extraction | |
| subject keywords | relative site occupancies | |
| subject keywords | si | |
| identifier doi | 10.1109/PVSC.2014.6925246 | |
| journal title | ower Electronics Conference (IPEC-Hiroshima 2014 - ECCE-ASIA), 2014 International | |
| filesize | 3078143 | |
| citations | 0 | |
| contributor rawauthor | Quang Trong Nha , Huang-Jen Chiu , Yu-Kang Lo , Pham Phu Hieu |