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Modeling of transient and static components of intrinsic emission from VLSI circuits

date accessioned2020-03-12T20:16:16Z
date available2020-03-12T20:16:16Z
date issued2014
identifier other6860639.pdf
identifier urihttp://libsearch.um.ac.ir:80/fum/handle/fum/1008310?locale-attribute=fa&show=full
formatgeneral
languageEnglish
publisherIEEE
titleModeling of transient and static components of intrinsic emission from VLSI circuits
typeConference Paper
contenttypeMetadata Only
identifier padid8130141
subject keywordsComputer architecture
subject keywordsDecoding
subject keywordsFiltering
subject keywordsRandom access memory
subject keywordsRegisters
subject keywordsThroughput
subject keywordsVery large scale integration
subject keywords8K UDTV
subject keywordsHEVC decoder
subject keywordsVLSI architecture
subject keywordsintra prediction
identifier doi10.1109/ICIP.2014.7025254
journal titleeliability Physics Symposium, 2014 IEEE International
filesize508342
citations0
contributor rawauthorShehata, A.B. , Stellari, F. , Weger, A. , Peilin Song


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