Search

Now showing items 1-3 of 3

DFSTT-MRAM: Dual Functional STT-MRAM Cell Structure for Reliability Enhancement and 3-D MLC Functionality

Type: Journal Paper

Author : Wang Kang; Weisheng Zhao; Zhaohao Wang; Yue Zhang; Klein, Jacques-Olivier; Chappert, Claude; Zhang, Ye; Ravelosona, Dafine

Publisher: IEEE

Year: 2014

Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Type: Journal Paper

Author : Wang Kang; Zheng Li; Zhaohao Wang; Deng, Erya; Klein, Jacques-Olivier; Youguang Zhang; Chappert, Claude; Ravelosona, Dafine; Weisheng Zhao

Publisher: IEEE

Year: 2014

Nonvolatile Boolean Logic Block Based on Ferroelectric Tunnel Memristor

Type: Journal Paper

Author : Zhaohao Wang; Weisheng Zhao; Wang Kang; Yue Zhang; Klein, Jacques-Olivier; Ravelosona, Dafine; Youguang Zhang; Chappert, Claude

Publisher: IEEE

Year: 2014

Search

DFSTT-MRAM: Dual Functional STT-MRAM Cell Structure for Reliability Enhancement and 3-D MLC Functionality

Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Nonvolatile Boolean Logic Block Based on Ferroelectric Tunnel Memristor

Author

Publisher

Year

Keywords

Type

Language (ISO)

Content Type

Publication Title

Search

Filters

DFSTT-MRAM: Dual Functional STT-MRAM Cell Structure for Reliability Enhancement and 3-D MLC Functionality

Variation-Tolerant High-Reliability Sensing Scheme for Deep Submicrometer STT-MRAM

Nonvolatile Boolean Logic Block Based on Ferroelectric Tunnel Memristor