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نمایش تعداد 1-4 از 4
AES design space exploration new line for scan attack resiliency
ناشر: IEEE
سال: 2014
Regaining Trust in VLSI Design: Design-for-Trust Techniques
ناشر: IEEE
سال: 2014
Test-mode-only scan attack and countermeasure for contemporary scan architectures
ناشر: IEEE
سال: 2014