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Resilience and yield of flip-flops in future CMOS technologies under process variations and aging

Type: Journal Paper

Author : Werner, Claudia; Backs, Benedikt; Wirnshofer, Martin; Schmitt-Landsiedel, Doris

Publisher: IET

Year: 2014

Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Type: Conference Paper

Author : Breitkreutz, Stephan; Eichwald, Irina; Ziemys, Grazvydas; Schmitt-Landsiedel, Doris; Becherer, Markus

Publisher: IEEE

Year: 2014

Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems

Type: Journal Paper

Author : Lueders, Michael; Eversmann, Bjoern; Gerber, Johannes; Huber, Korbinian; Kuhn, Ruediger; Zwerg, Michael; Schmitt-Landsiedel, Doris; Brederlow, Ralf

Publisher: IEEE

Year: 2014

Power efficient digital IC design for a medical application with high reliability requirements

Type: Conference Paper

Author : Aryan, Nasim Pour; Heidmann, Nils; Wirnshofer, Martin; Hellwege, Nico; Pistor, Jonas; Peters-Drolshagen, Dagmar; Georgakos, Georg; Paul, Steffen; Schmitt-Landsiedel, Doris

Publisher: IEEE

Year: 2014

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Resilience and yield of flip-flops in future CMOS technologies under process variations and aging

Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems

Power efficient digital IC design for a medical application with high reliability requirements

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Resilience and yield of flip-flops in future CMOS technologies under process variations and aging

Influence of the domain wall nucleation time on the reliability of perpendicular Nanomagnetic Logic

Architectural and Circuit Design Techniques for Power Management of Ultra-Low-Power MCU Systems

Power efficient digital IC design for a medical application with high reliability requirements