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Author : Besnard, G.; Garros, X.; Andrieu, F.; Nguyen, P.; Van Den Daele, W.; Reynaud, P.; Schwarzenbach, W.; Delprat, D.; Bourdelle, K.K.; Reimbold, G.; Cristoloveanu, S.

Publisher: IEEE

Year: 2014

A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology

Type: Journal Paper

Author : El Husseini, J.; Garros, X.; Cluzel, J.; Subirats, A.; Makosiej, A.; Weber, O.; Thomas, O.; Huard, V.; Federspiel, X.; Reimbold, G.

Publisher: IEEE

Year: 2014

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Modified 1/f trapping noise theory and experiments in MOS transistors biased from weak to strong inversion—Influence of interface states

Piezoresistivity in unstrained and strained SOI MOSFETs

Characterization of piezoresistive coefficients in silicon nanowire transistors

Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes

A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology

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Modified 1/f trapping noise theory and experiments in MOS transistors biased from weak to strong inversion—Influence of interface states

Piezoresistivity in unstrained and strained SOI MOSFETs

Characterization of piezoresistive coefficients in silicon nanowire transistors

Superior performance and Hot Carrier reliability of Strained FDSOI nMOSFETs for advanced CMOS technology nodes

A Complete Characterization and Modeling of the BTI-Induced Dynamic Variability of SRAM Arrays in 28-nm FD-SOI Technology