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نمایش تعداد 1-5 از 5
NBTI and Leakage Reduction Using ILP-Based Approach
ناشر: IEEE
سال: 2014
Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing
ناشر: IEEE
سال: 2014
BTI-Aware Sleep Transistor Sizing Algorithm for Reliable Power Gating Designs
ناشر: IEEE
سال: 2014