Search

English
- Persian
- English
Login

Ferdowsi University of Mashhad
|
Information Center and Central Library

- Persian
- English

Home
Source Types
- Journal Paper
- Ebook
- Conference Paper
- Standard
- Protocol
- Thesis
Use Help

FUM Digital Library
Search

FUM Digital Library
Search

All Fields
Title
Author
Year
Publisher
Subject
Publication Title
ISSN
DOI
ISBN

Advanced Search

JavaScript is disabled for your browser. Some features of this site may not work without it.

Search

Show Advanced Filters Hide Advanced Filters

Filters

Use filters to refine the search results.

Now showing items 1-5 of 5

Relevance
Title Asc
Title Desc
Year Asc
Year Desc

5
10
20
40
60
80
100

CSV
RIS

Sort Options:
Relevance
Title Asc
Title Desc
Issue Date Asc
Issue Date Desc
Results Per Page:
5
10
20
40
60
80
100

Aging-Aware Reliable Multiplier Design With Adaptive Hold Logic

Type: Journal Paper

Author : Ing-Chao Lin; Yu-Hung Cho; Yi-Ming Yang

Year: 2015

NBTI and Leakage Reduction Using ILP-Based Approach

Type: Journal Paper

Author : Ing-Chao Lin; Kuan-Hui Li; Chia-Hao Lin; Kai-Chiang Wu

Publisher: IEEE

Year: 2014

Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing

Type: Journal Paper

Author : Yi-Hua Li; Wei-Cheng Lien; Ing-Chao Lin; Kuen-Jong Lee

Publisher: IEEE

Year: 2014

BTI-Aware Sleep Transistor Sizing Algorithm for Reliable Power Gating Designs

Type: Journal Paper

Author : Kai-Chiang Wu; Ing-Chao Lin; Yao-Te Wang; Shuen-Shiang Yang

Publisher: IEEE

Year: 2014

CASA: Contention-Aware Scratchpad Memory Allocation for Online Hybrid On-Chip Memory Management

Type: Journal Paper

Author : Da-Wei Chang; Ing-Chao Lin; Yu-Shiang Chien; Chin-Lun Lin; Su, Alvin W.-Y; Chung-Ping Young

Publisher: IEEE

Year: 2014

Author

Ing-Chao Lin (5)

Kai-Chiang Wu (2)

Chia-Hao Lin (1)

Chin-Lun Lin (1)

Chung-Ping Young (1)

Da-Wei Chang (1)

Kuan-Hui Li (1)

Kuen-Jong Lee (1)

Shuen-Shiang Yang (1)

Su, Alvin W.-Y (1)

Publisher

IEEE (4)

Year

2015 (1)

2014 (4)

Keywords

Degradation (2)

low-power electronics (2)

MOSFET (2)

negative bias temperature instability (2)

89 benchmark circuits (1)

99 benchmark circuits (1)

Agi (1)

Algorithm design and analysis (1)

area overhead reduction (1)

at-speed scan-based testing (1)

Type

Journal Paper (5)

Language (ISO)

English (5)

Content Type

Metadata Only (4)

Fulltext (1)

Publication Title

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on (3)

IEEE Transactions on Very Large Scale Integration (VLSI) Systems (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

About Us

نرم افزار کتابخانه دیجیتال "دی اسپیس" فارسی شده توسط یابش برای کتابخانه های ایرانی | تماس با یابش

DSpace software copyright © 2019-2022 DuraSpace