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Steep switching tunnel FET: A promise to extend the energy efficient roadmap for post-CMOS digital and analog/RF applications

Type: Journal Paper

Author : Huichu Liu; Suman Datta; Vijaykrishnan Narayanan

Year: 2013

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Tunnel FET technology: A reliability perspective

Type: Journal Paper

Author : Suman Datta; Huichu Liu; Vijaykrishnan Narayanan

Year: 2014

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Electrical Noise in Heterojunction Interband Tunnel FETs

Type: Journal Paper

Author : Pandey, Rashmi; Rajamohanan, Bijesh; Huichu Liu; Narayanan, Vijaykrishnan; Datta, Soupayan

Publisher: IEEE

Year: 2014

Technology assessment of Si and III-V FinFETs and III-V tunnel FETs from soft error rate perspective

Type: Journal Paper

Author : Huichu Liu; Matthew Cotter; Suman Datta; Vijay Narayanan

Year: 2012

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Impact of Variation in Nanoscale Silicon and Non-Silicon FinFETs and Tunnel FETs on Device and SRAM Performance

Type: Journal Paper

Author : Nidhi Agrawal; Huichu Liu; Reza Arghavani; Vijay Narayanan; Suman Datta

Year: 2015

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Soft-Error Performance Evaluation on Emerging Low Power Devices

Type: Journal Paper

Author : Huichu Liu; Cotter, Matthew; Datta, Soupayan; Narayanan, Vijaykrishnan

Publisher: IEEE

Year: 2014

Enabling high-performance heterogeneous TFET/CMOS logic with novel circuits using TFET unidirectionality and low-VDD operation

Type: Journal Paper

Author : Daniel H. Morris; Kaushik Vaidyanathan; Uygar E. Avci; Huichu Liu; Tanay Karnik; Ian A. Young

Year: 2016

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Thermal-Aware Application Scheduling on Device-Heterogeneous Embedded Architectures

Type: Journal Paper

Author : Karthik Swaminathan; Jagadish Kotra; Huichu Liu; Jack Sampson; Mahmut Kandemir; Vijaykrishnan Narayanan

Year: 2015

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A Steep-Slope Tunnel FET Based SAR Analog-to-Digital Converter

Type: Journal Paper

Author : Moon Seok Kim; Huichu Liu; Xueqing Li; Suman Datta; Vijaykrishnan Narayanan

Year: 2014

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Rf-powered systems using steep-slope devices

Type: Conference Paper

Author : Xueqing Li; Heo, U.D.; Kaisheng Ma; Narayanan, V.; Huichu Liu; Datta, S.

Publisher: IEEE

Year: 2014

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Steep switching tunnel FET: A promise to extend the energy efficient roadmap for post-CMOS digital and analog/RF applications

Tunnel FET technology: A reliability perspective

Electrical Noise in Heterojunction Interband Tunnel FETs

Technology assessment of Si and III-V FinFETs and III-V tunnel FETs from soft error rate perspective

Impact of Variation in Nanoscale Silicon and Non-Silicon FinFETs and Tunnel FETs on Device and SRAM Performance

Soft-Error Performance Evaluation on Emerging Low Power Devices

Enabling high-performance heterogeneous TFET/CMOS logic with novel circuits using TFET unidirectionality and low-VDD operation

Thermal-Aware Application Scheduling on Device-Heterogeneous Embedded Architectures

A Steep-Slope Tunnel FET Based SAR Analog-to-Digital Converter

Rf-powered systems using steep-slope devices

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Steep switching tunnel FET: A promise to extend the energy efficient roadmap for post-CMOS digital and analog/RF applications

Tunnel FET technology: A reliability perspective

Electrical Noise in Heterojunction Interband Tunnel FETs

Technology assessment of Si and III-V FinFETs and III-V tunnel FETs from soft error rate perspective

Impact of Variation in Nanoscale Silicon and Non-Silicon FinFETs and Tunnel FETs on Device and SRAM Performance

Soft-Error Performance Evaluation on Emerging Low Power Devices

Enabling high-performance heterogeneous TFET/CMOS logic with novel circuits using TFET unidirectionality and low-VDD operation

Thermal-Aware Application Scheduling on Device-Heterogeneous Embedded Architectures

A Steep-Slope Tunnel FET Based SAR Analog-to-Digital Converter

Rf-powered systems using steep-slope devices