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    A composite CMOS gate array with 4K RAM and 128K ROM 

    Type: Journal Paper
    Author : Miyahara, N.; Ishikawa, K.; Hamaguchi, S.; Horiguchi, S.; Aoki, M.
    Year: 1986
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    Investigation of Frictional Force Applied to Strands Surrounded by Other Strands and Tribological Analysis of Contact Surface in CIC Conductor 

    Type: Journal Paper
    Author : Yagai, T.; Kudo, Hiroyuki; Hamano, Kota; Yoshida, Kenta; Hamaguchi, S.; Natsume, K.; Obana, T.
    Publisher: IEEE
    Year: 2014

    Development and Test of JT-60SA Central Solenoid Model Coil 

    Type: Journal Paper
    Author : Murakami, H.; Kizu, K.; Tsuchiya, K.; Koide, Y.; Yoshida, Kenta; Obana, T.; Takahata, K.; Hamaguchi, S.; Chikaraishi, H.; Natsume, K.; Mito, T.; Imagwa, S.; Nomoto, Kazuki; Imai, Yuki
    Publisher: IEEE
    Year: 2014

    Thermal Stability of Butt Joint for CS Conductor in JT-60SA 

    Type: Journal Paper
    Author : Takao, Tomoaki; Kawahara, Yuki; Nakamura, Kentaro; Yamamoto, Yusaku; Yagai, T.; Murakami, H.; Yoshida, Kenta; Natsume, K.; Hamaguchi, S.; Obana, T.; Takahata, K.; Imagawa, S.; Mito, T.
    Publisher: IEEE
    Year: 2014

    Critical Current Measurement of 30 kA-Class HTS Conductor Samples 

    Type: Journal Paper
    Author : Terazaki, Y.; Yanagi, N.; Ito, Satoshi; Kawai, Kunihiro; Seino, Yutaro; Ohinata, T.; Tanno, Yoshiki; Natsume, K.; Hamaguchi, S.; Noguchi, Hiroki; Tamura, H.; Mito, T.; Hashizume, Hidetoshi; Sagara, Akihiko
    Publisher: IEEE
    Year: 2014

    Performance of a Mechanical Bridge Joint for 30-kA-Class High-Temperature Superconducting Conductors 

    Type: Journal Paper
    Author : Ito, Satoshi; Kawai, Kunihiro; Seino, Yutaro; Ohinata, T.; Tanno, Yoshiki; Yanagi, N.; Terazaki, Y.; Natsume, K.; Hamaguchi, S.; Noguchi, Hiroki; Tamura, H.; Mito, T.; Sagara, Akihiko; Hashizume, Hidetoshi
    Publisher: IEEE
    Year: 2014

    Progress of the Design of HTS Magnet Option and R&D Activities for the Helical Fusion Reactor 

    Type: Journal Paper
    Author : Yanagi, N.; Terazaki, Y.; Ito, Satoshi; Kawai, Kunihiro; Seino, Yutaro; Ohinata, T.; Tanno, Yoshiki; Natsume, K.; Hamaguchi, S.; Noguchi, Hiroki; Tamura, H.; Mito, T.; Hashizume, Hidetoshi; Sagara, Akihiko
    Publisher: IEEE
    Year: 2014

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