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Accurate Analytical Single-Photoelectron Response of Silicon Photomultipliers

Type: Journal Paper

Author : Marano, Davide; Belluso, Massimiliano; Bonanno, Giovanni; Billotta, Sergio; Grillo, Alessandro; Garozzo, Salvatore; Romeo, Giuseppe

Publisher: IEEE

Year: 2014

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors—Part I: Electrical Tests

Type: Journal Paper

Author : Bonanno, Giovanni; Marano, Davide; Belluso, Massimiliano; Billotta, Sergio; Grillo, Alessandro; Garozzo, Salvatore; Romeo, Giuseppe; Timpanaro, Maria Cristina

Publisher: IEEE

Year: 2014

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors - Part II: Optical Tests

Type: Journal Paper

Author : Bonanno, Giovanni; Marano, Davide; Belluso, Massimiliano; Billotta, Sergio; Grillo, Alessandro; Garozzo, Salvatore; Romeo, Giuseppe; Timpanaro, Maria Cristina

Publisher: IEEE

Year: 2014

Silicon Photomultipliers Electrical Model Extensive Analytical Analysis

Type: Journal Paper

Author : Marano, Davide; Belluso, Massimiliano; Bonanno, Giovanni; Billotta, Sergio; Grillo, Alessandro; Garozzo, Salvatore; Romeo, Giuseppe; Catalano, O.; La Rosa, G.; Sottile, G.; Impiombato, D.; Giarrusso, S.

Publisher: IEEE

Year: 2014

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Accurate Analytical Single-Photoelectron Response of Silicon Photomultipliers

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors—Part I: Electrical Tests

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors - Part II: Optical Tests

Silicon Photomultipliers Electrical Model Extensive Analytical Analysis

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Accurate Analytical Single-Photoelectron Response of Silicon Photomultipliers

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors&#x2014;Part I: Electrical Tests

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors - Part II: Optical Tests

Silicon Photomultipliers Electrical Model Extensive Analytical Analysis

Characterization Measurements Methodology and Instrumental Set-Up Optimization for New SiPM Detectors—Part I: Electrical Tests