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    Modeling and extraction technique for parasitic resistances in MOSFETs Combining DC I–V and low frequency C–V measurement 

    Type: Journal Paper
    Author : Ja Sun Shin; Hagyoul Bae; Euiyoun Hong; Jaeman Jang; Daeyoun Yun; Jieun Lee; Dae Hwan Kim; Dong Myong Kim
    Publisher: Elsevier Science
    Year: 2012
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    Study on the Photoresponse of Amorphous In–Ga–Zn–O and Zinc Oxynitride Semiconductor Devices by the Extraction of Sub-Gap-State Distribution and Device Simulation 

    Type: Journal Paper
    Author : Jun Tae Jang; Jozeph Park; Byung Du Ahn; Dong Myong Kim; Sung-Jin Choi; Hyun-Suk Kim; Dae Hwan Kim
    Year: 2015
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    Extraction of Propagation Delay-Correlated Mobility and Its Verification for Amorphous InGaZnO Thin-Film Transistor-Based Inverters 

    Type: Journal Paper
    Author : Kyung Min Lee; Jaeman Jang; Sung-Jin Choi; Dong Myong Kim; Kyung Rok Kim; Dae Hwan Kim
    Year: 2015
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    Physical Origins and Analysis of Negative-Bias Stress Instability Mechanism in Polymer-Based Thin-Film Transistors 

    Type: Journal Paper
    Author : Jaewook Lee; Jaeman Jang; Hyeongjung Kim; Jiyoul Lee; Bang-Lin Lee; Sung-Jin Choi; Dong Myong Kim; Dae Hwan Kim; Kyung Rok Kim
    Publisher: IEEE
    Year: 2014

    Investigation of Sensor Performance in Accumulation- and Inversion-Mode Silicon Nanowire pH Sensors 

    Type: Journal Paper
    Author : Jieun Lee; Bongsik Choi; Seonwook Hwang; Jung Han Lee; Byung-Gook Park; Tae Jung Park; Dong Myong Kim; Dae Hwan Kim; Sung-Jin Choi
    Publisher: IEEE
    Year: 2014

    Characterization and Capacitive Modeling of Target Concentration-Dependent Subthreshold Swing in Silicon Nanoribbon Biosensors 

    Type: Journal Paper
    Author : Won Hee Lee; Jin-Moo Lee; Mihee Uhm; Jieun Lee; Kyung Rok Kim; Sung-Jin Choi; Dong Myong Kim; Yong-Joo Jeong; Dae Hwan Kim
    Publisher: IEEE
    Year: 2014

    Fully Current-Based Sub-Bandgap Optoelectronic Differential Ideality Factor Technique and Extraction of Subgap DOS in Amorphous Semiconductor TFTs 

    Type: Journal Paper
    Author : Hagyoul Bae; Hyojoon Seo; Sungwoo Jun; Hyunjun Choi; Jaeyeop Ahn; Junseok Hwang; Jungmin Lee; Oh, Sung-Min; Jong-Uk Bae; Sung-Jin Choi; Dae Hwan Kim; Dong Myong Kim
    Publisher: IEEE
    Year: 2014

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