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Surface Passivation of Ge MOS Devices by <formula formulatype="inline"> <img src="/images/tex/21412.gif" alt="{\\rm SmGeO}_{\\bf{x}}"> </formula> With Sub-nm EOT

Type: Journal Paper

Author : Chia-Chun Lin; Yung-Hsien Wu; Chao-Yi Wu; Ching-Wei Lee

Publisher: IEEE

Year: 2014

Characterization of membrane fouling distribution in a spiral wound module using high-frequency ultrasound image analysis

Type: Journal Paper

Author : Kuo-Lun Tung; Hui-Chieh Teoh; Ching-Wei Lee; Chien-Hua Chen; Yu-Ling Li; Yi-Feng Lin; Ching-Liang Chen; Meng-Shun Huang

Year: 2015

Author

Ching-Wei Lee (2)

Chao-Yi Wu (1)

Chia-Chun Lin (1)

Chien-Hua Chen (1)

Ching-Liang Chen (1)

Hui-Chieh Teoh (1)

Kuo-Lun Tung (1)

Meng-Shun Huang (1)

Yi-Feng Lin (1)

Yu-Ling Li (1)

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IEEE (1)

Year

2015 (1)

2014 (1)

Keywords

/sub&gt (1)

annealing (1)

bias temperature instability (1)

bulk dielectric (1)

capacitance measurement (1)

conduction band offset (1)

conduction bands (1)

dielectric materials (1)

elemental semiconductors (1)

equivalent oxide th (1)

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Journal Paper (2)

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English (2)

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Fulltext (1)

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Electron Device Letters, IEEE (1)

Journal of Membrane Science (1)

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