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Novel small signal modeling and control of an LLC resonant converter

Type: Conference Paper

Author : Cheng, B. , Musavi, F. , Dunford, W.G.

Publisher: IEEE

Year: 2014

Simulation of 3D FinFET doping profiles introduced by ion implantation and the impact on device performance

Type: Conference Paper

Author : Liping Wang; Brown, A.; Cheng, B.; Asenov, A.

Publisher: IEEE

Year: 2014

Dose distribution considerations of medium energy electron beams at extended source-to-surface distance

Type: Journal Paper

Author : Cheng B. Saw; Komanduri M. Ayyangar; Todd Pawlicki; Leroy J. Korb

Year: 1995

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Electroluminescence intensity analysis of neutral bulk and space charge region collection effects on large-area CIGS module performance

Type: Conference Paper

Author : Guozhen Yue; Dingyuan Lu; Cheng, B.; Baosheng Sang; Stanbery, B.J.

Publisher: IEEE

Year: 2014

3D coupled electro-thermal simulations for SOI FinFET with statistical variations including the fin shape dependence of the thermal conductivity

Type: Conference Paper

Author : Wang, L.; Brown, A.R.; Nedjalkov, M.; Alexander, C.; Cheng, B.; Millar, C.; Asenov, A.

Publisher: IEEE

Year: 2014

3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity

Type: Conference Paper

Author : Wang, L.; Brown, A.R.; Nedjalkov, M.; Alexander, C.; Cheng, B.; Millar, C.; Asenov, A.

Publisher: IEEE

Year: 2014

Commissioning and quality assurance for Mlc-Based IMRT

Type: Journal Paper

Author : Cheng B Saw; Komanduri M Ayyangar; Weining Zhen; Robert B Thompson; Charles A Enke

Year: 2001

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Variability-aware compact model strategy for 20-nm bulk MOSFETs

Type: Conference Paper

Author : Xingsheng Wang; Reid, D.; Liping Wang; Burenkov, A.; Millar, C.; Cheng, B.; Lange, A.; Lorenz, J.; Baer, E.; Asenov, A.

Publisher: IEEE

Year: 2014

The discrepancy between the uniform and variability aware atomistic TCAD simulations of decananometer bulk MOSFETs and FinFETs

Type: Conference Paper

Author : Adamu-Lema, F.; Amoroso, S.M.; Wang, X.; Cheng, B.; Shifren, L.; Aitken, R.; Sinha, S.; Yeric, G.; Asenov, A.

Publisher: IEEE

Year: 2014

Predictive simulation of future CMOS technologies and their impact on circuits

Type: Conference Paper

Author : Asenov, A.; Cheng, B.; Adamu-Lema, F.; Shifren, L.; Sinha, S.; Riddet, C.; Alexander, C.; Brown, A.R.; Wang, X.; Amoroso, S.M.

Publisher: IEEE

Year: 2014

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Novel small signal modeling and control of an LLC resonant converter

Simulation of 3D FinFET doping profiles introduced by ion implantation and the impact on device performance

Dose distribution considerations of medium energy electron beams at extended source-to-surface distance

Electroluminescence intensity analysis of neutral bulk and space charge region collection effects on large-area CIGS module performance

3D coupled electro-thermal simulations for SOI FinFET with statistical variations including the fin shape dependence of the thermal conductivity

3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity

Commissioning and quality assurance for Mlc-Based IMRT

Variability-aware compact model strategy for 20-nm bulk MOSFETs

The discrepancy between the uniform and variability aware atomistic TCAD simulations of decananometer bulk MOSFETs and FinFETs

Predictive simulation of future CMOS technologies and their impact on circuits

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Novel small signal modeling and control of an LLC resonant converter

Simulation of 3D FinFET doping profiles introduced by ion implantation and the impact on device performance

Dose distribution considerations of medium energy electron beams at extended source-to-surface distance

Electroluminescence intensity analysis of neutral bulk and space charge region collection effects on large-area CIGS module performance

3D coupled electro-thermal simulations for SOI FinFET with statistical variations including the fin shape dependence of the thermal conductivity

3D coupled electro-thermal FinFET simulations including the fin shape dependence of the thermal conductivity

Commissioning and quality assurance for Mlc-Based IMRT

Variability-aware compact model strategy for 20-nm bulk MOSFETs

The discrepancy between the uniform and variability aware atomistic TCAD simulations of decananometer bulk MOSFETs and FinFETs

Predictive simulation of future CMOS technologies and their impact on circuits