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نمایش تعداد 1-10 از 42

Total Ionizing Dose Effects on DRAM Data Retention Time

نوع: Journal Paper

نویسنده : Bacchini, Angelo; Furano, Gianluca; Rovatti, Marco; Ottavi, Marco

ناشر: IEEE

سال: 2014

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

نوع: Journal Paper

نویسنده : Diggins, Zachary J.; Mahadevan, Nagabhushan; Herbison, Dan; Karsai, Gabor; Sierawski, Brian D.; Barth, Eric; Pitt, E. Bryn; Reed, R.A.; Schrimpf, R.D.; Weller, Robert /A/.; Alles, Michael L.; Witulski, Arthur

ناشر: IEEE

سال: 2014

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

نوع: Journal Paper

نویسنده : Joon-Bae Moon; Dong-Il Moon; Yang-Kyu Choi

ناشر: IEEE

سال: 2014

Sizing of concentrated-wound permanent-magnet machines using thermal analysis

نوع: Conference Paper

نویسنده : Baker, J.L. , Drury, D. , Mellor, P.H.

ناشر: IEEE

سال: 2014

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

نوع: Journal Paper

نویسنده : Chao Peng; Zhiyuan Hu; Bingxu Ning; Huixiang Huang; Zhengxuan Zhang; Dawei Bi; Yunfei En; Shichang Zou

ناشر: IEEE

سال: 2014

Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

نوع: Journal Paper

نویسنده : Lili Ding; Hongxia Guo; Wei Chen; Zhibin Yao; Yihua Yan; Dongliang Chen; Paccagnella, Alessandro; Gerardin, Simone; Bagatin, Marta; Lei Chen; Huabo Sun; Ruyu Fan

ناشر: IEEE

سال: 2014

Ground Penetrating Radar's performance against different types of surfaces. Study case of the ‘Casino of Officers’, City of Buenos Aires, Argentina

نوع: Conference Paper

نویسنده : Bonato, Cesar; Elichiri, Pamela A.; Lopez, Eduardo D.; Pasik, Barbara; Dushevskyy, Aleks

ناشر: IEEE

سال: 2014

Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory

نوع: Journal Paper

نویسنده : Gonzalez-Velo, Y.; Barnaby, H.J.; Kozicki, M.N.; Gopalan, Chakravarthy; Holbert, Keith

ناشر: IEEE

سال: 2014

A Capability Maturity Model for R&M engineering

نوع: Conference Paper

نویسنده : van Baaren, R.J. , Curran, R.

ناشر: IEEE

سال: 2014

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

نوع: Conference Paper

نویسنده : Nath, K. , Dhar, S. , Basishtha, S.

ناشر: IEEE

سال: 2014

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Total Ionizing Dose Effects on DRAM Data Retention Time

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Sizing of concentrated-wound permanent-magnet machines using thermal analysis

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

Ground Penetrating Radar's performance against different types of surfaces. Study case of the ‘Casino of Officers’, City of Buenos Aires, Argentina

Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory

A Capability Maturity Model for R&M engineering

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

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Total Ionizing Dose Effects on DRAM Data Retention Time

Total-Ionizing-Dose Induced Timing Window Violations in CMOS Microcontrollers

Influence of Total Ionizing Dose on Sub-100&#x00A0;nm Gate-All-Around MOSFETs

Sizing of concentrated-wound permanent-magnet machines using thermal analysis

Total-Ionizing-Dose Induced Coupling Effect in the 130-nm PDSOI I/O nMOSFETs

Analysis of TID Failure Modes in SRAM-Based FPGA Under Gamma-Ray and Focused Synchrotron X-Ray Irradiation

Ground Penetrating Radar's performance against different types of surfaces. Study case of the &#x2018;Casino of Officers&#x2019;, City of Buenos Aires, Argentina

Total Ionizing Dose Retention Capability of Conductive Bridging Random Access Memory

A Capability Maturity Model for R&amp;M engineering

Web 1.0 to Web 3.0 - Evolution of the Web and its various challenges

Influence of Total Ionizing Dose on Sub-100 nm Gate-All-Around MOSFETs

Ground Penetrating Radar's performance against different types of surfaces. Study case of the ‘Casino of Officers’, City of Buenos Aires, Argentina

A Capability Maturity Model for R&M engineering