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نمایش تعداد 1-7 از 7
Built-In EVM Measurement With Negligible Hardware Overhead
ناشر: IEEE
سال: 2014
An effective deterministic test generation for test-per-clock testing
ناشر: IEEE
سال: 2014
Pair-wise Diversity Measure for Multiple Classifier System Based on Evidence Theory
ناشر: IEEE
سال: 2014
Analyzing space rapid response key technologies based on the data relay system
ناشر: IEEE
سال: 2014