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نمایش تعداد 1-10 از 45

A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

نوع: Journal Paper

نویسنده : Wenjie Lu; Guo, Anjin; Vardi, Alon; del Alamo, Jesus /A/.

ناشر: IEEE

سال: 2014

Single-phase electric drive for automotive applications

نوع: Conference Paper

نویسنده : Vodovozov, V. , Lillo, N. , Raud, Z.

ناشر: IEEE

سال: 2014

Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

نوع: Journal Paper

نویسنده : Jeong, Sangkwon; Lee, Edward; Yim, Mark; Yoon, Giwan

ناشر: IET

سال: 2014

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

نوع: Journal Paper

نویسنده : Muller, Johannes; Hannebauer, Helge; Mader, Christoph; Haase, Frerk; Bothe, Klaus

ناشر: IEEE

سال: 2014

Aluminum-Based Rear-Side PVD Metallization for nPERT Silicon Solar Cells

نوع: Journal Paper

نویسنده : Katkhouda, Kamal; Martinez-Limia, Alberto; Bornschein, Lutz; Koseva, Radinka; Geppert, Torsten; Grohe, Andreas; Krokoszinski, Hans-Joachim; Schaaf, P.

ناشر: IEEE

سال: 2014

OpenPLC: An open source alternative to automation

نوع: Conference Paper

نویسنده : Alves, Thiago Rodrigues; Buratto, Mario; de Souza, Flavio Mauricio; Rodrigues, Thelma Virginia

ناشر: IEEE

سال: 2014

RC-Constant in Organic Photodiodes Comprising Electrodes With a Significant Sheet Resistance

نوع: Journal Paper

نویسنده : Mescher, Jan; Kettlitz, Siegfried W.; Egel, Amos; Moosmann, Carola; Christ, Nico S.; Valouch, Sebastian; Lemmer, Uli

ناشر: IEEE

سال: 2014

Piezoresistive Effect of p-Type Single Crystalline 3C-SiC Thin Film

نوع: Journal Paper

نویسنده : Hoang-Phuong Phan; Tanner, Philip; Dzung Viet Dao; Li Wang; Nam-Trung Nguyen; Yong Zhu; Dimitrijev, Sima

ناشر: IEEE

سال: 2014

A low supply voltage 2µW half bandgap reference in standard sub-µ CMOS

نوع: Conference Paper

نویسنده : Far, A.

سال: 2014

Process-Variation Aware Multi-temperature Test Scheduling

نوع: Conference Paper

نویسنده : Aghaee, N. , Peng, Z. , Eles, P.

سال: 2014

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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Single-phase electric drive for automotive applications

Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

Aluminum-Based Rear-Side PVD Metallization for nPERT Silicon Solar Cells

OpenPLC: An open source alternative to automation

RC-Constant in Organic Photodiodes Comprising Electrodes With a Significant Sheet Resistance

Piezoresistive Effect of p-Type Single Crystalline 3C-SiC Thin Film

A low supply voltage 2µW half bandgap reference in standard sub-µ CMOS

Process-Variation Aware Multi-temperature Test Scheduling

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A Test Structure to Characterize Nano-Scale Ohmic Contacts in III-V MOSFETs

Single-phase electric drive for automotive applications

Excellent epitaxial graphene layers grown simply on SiC substrates and their characterisation

Dynamic Infrared Lifetime Mapping for the Measurement of the Saturation Current Density of Highly Doped Regions in Silicon

Aluminum-Based Rear-Side PVD Metallization for nPERT Silicon Solar Cells

OpenPLC: An open source alternative to automation

RC-Constant in Organic Photodiodes Comprising Electrodes With a Significant Sheet Resistance

Piezoresistive Effect of p-Type Single Crystalline 3C-SiC Thin Film

A low supply voltage 2&#x00B5;W half bandgap reference in standard sub-&#x00B5; CMOS

Process-Variation Aware Multi-temperature Test Scheduling

A low supply voltage 2µW half bandgap reference in standard sub-µ CMOS