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    Thermal Rectifier Based on p-n Junction 

    Type: Journal Paper
    Author : Kislitsyn, Viktor; Pavliuk, Sergiy; Soltys, Roman; Lozovski, Valeri; Strilchuk, Galyna
    Publisher: IEEE
    Year: 2014

    Prostate cancer segmentation from multiparametric MRI based on fuzzy Bayesian model 

    Type: Conference Paper
    Author : Guo, Yu , Ruan, Su , Walker, Paul , Feng, Yuanming
    Publisher: IEEE
    Year: 2014

    Tandem Solar Cells Based on High-Efficiency c-Si Bottom Cells: Top Cell Requirements for >30% Efficiency 

    Type: Journal Paper
    Author : White, T.P.; Lal, Niraj N.; Catchpole, Kylie R.
    Publisher: IEEE
    Year: 2014

    Temperature Sensing for Power MOSFETs in Short-Duration Avalanche Mode 

    Type: Journal Paper
    Author : Azoui, Toufik; Tounsi, Patrick; Pasquet, G.; Reynes, Jean-Michel; Pomes, Emilie; Dorkel, Jean-Marie
    Publisher: IEEE
    Year: 2014

    Equivalent Substrate Model for Lateral Super Junction Device 

    Type: Journal Paper
    Author : Bo Zhang; Wentong Zhang; Zehong Li; Ming Qiao; Zhaoji Li
    Publisher: IEEE
    Year: 2014

    Mechanisms Leading to Losses in Conventional Betavoltaics and Evolution: Utilizing Composite Semiconductor With Infused Radioisotope for Efficiency Improvement 

    Type: Journal Paper
    Author : Wacharasindhu, Tongtawee; Nullmeyer, Bradley R.; Kwon, Jae W.; Robertson, J. David; Garnov, Alexander Y.
    Publisher: IEEE
    Year: 2014

    NoC Scheduling for Improved Application-Aware and Memory-Aware Transfers in Multi-core Systems 

    Type: Conference Paper
    Author : Pimpalkhute, T. , Pasricha, S.
    Year: 2014

    A Decimal/Binary Multi-operand Adder Using a Fast Binary to Decimal Converter 

    Type: Conference Paper
    Author : Varma, C.S. , Ahmed, S.E. , Srinivas, M.B.
    Year: 2014

    FRANTIC: A Fast Reference-based Algorithm for Network Tomography via compressive sensing 

    Type: Conference Paper
    Author : Sheng Cai , Bakshi, M. , Jaggi, S. , Minghua Chen
    Year: 2014

    A Scenario Method to Automatically Assess ICT Risk 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014
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