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نمایش تعداد 1-8 از 8

Chronology Central Asia and the Caucasus

نوع: Journal Paper

ناشر: Middle East Institute

سال: 2014

Chronology: Tunisia

نوع: Journal Paper

ناشر: Middle East Institute

سال: 2014

Chronology: Iran

نوع: Journal Paper

ناشر: Middle East Institute

سال: 2014

Optimal censor-based detection in cooperative spectrum sensing

نوع: Conference Paper

نویسنده : Modarres-Hashemi, M.; Berenjkoub, E.; Janatian, N.

ناشر: IEEE

سال: 2014

Analyzing the Political Landscape of 2012 Korean Presidential Election in Twitter

نوع: Journal Paper

نویسنده : Min Song; Meen Chul Kim; Yoo Kyung Jeong

ناشر: IEEE

سال: 2014

Application of Artificial Neural Networks in predicting abrasion resistance of solution polymerized styrene-butadiene rubber based composites

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Message from the Workshop Organizers - ADMNET 2014

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Susceptibility analysis of an operational amplifier using on-chip measurement

نوع: Conference Paper

نویسنده : Huang, H.; Boyer, A.; Ben Dhia, S.; Vrignon, B.

ناشر: IEEE

سال: 2014

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Chronology Central Asia and the Caucasus

Chronology: Tunisia

Chronology: Iran

Optimal censor-based detection in cooperative spectrum sensing

Analyzing the Political Landscape of 2012 Korean Presidential Election in Twitter

Application of Artificial Neural Networks in predicting abrasion resistance of solution polymerized styrene-butadiene rubber based composites

Message from the Workshop Organizers - ADMNET 2014

Susceptibility analysis of an operational amplifier using on-chip measurement

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Chronology Central Asia and the Caucasus

Chronology: Tunisia

Chronology: Iran

Optimal censor-based detection in cooperative spectrum sensing

Analyzing the Political Landscape of 2012 Korean Presidential Election in Twitter

Application of Artificial Neural Networks in predicting abrasion resistance of solution polymerized styrene-butadiene rubber based composites

Message from the Workshop Organizers - ADMNET 2014

Susceptibility analysis of an operational amplifier using on-chip measurement