Within-die process variation is increasing in nanometer-scale process technologies. We observe that the same SRAM cell leaks differently under within-die process variations when storing 0 compared to 1; this difference can be up to 3 orders...

, these approaches may fail to achieve efficient performance yield. In this paper, we present a temperature-aware quasi-static task mapping–scheduling framework under process variation for hard real-time and periodic systems on MPSoCs. By employing the stochastic...