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نمایش تعداد 1-10 از 10
A microcontroller-based yarn twist tester
ناشر: IEEE
سال: 2014
Two level dynamic approach for Feature Envy detection
ناشر: IEEE
سال: 2014
Electronics for characterizing and using photovoltaics
ناشر: IEEE
سال: 2014
Organization
ناشر: IEEE
سال: 2014
Fast SAO estimation algorithm and its VLSI architecture
ناشر: IEEE
سال: 2014
Application of hierarchical modulation to optical access network
ناشر: IEEE
سال: 2014