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    Characterization of wireless mesh network performance in agricultural environments 

    Type: Conference Paper
    Author : Abouzar, Pooyan; Michelson, David G.
    Publisher: IEEE
    Year: 2014

    A new metrics selection method for software defect prediction 

    Type: Conference Paper
    Author : Xia, Ye; Yan, Guoying; Jiang, Xingwei; Yang, Yanyan
    Publisher: IEEE
    Year: 2014

    Bit error rate testing scheme for digital communication devices 

    Type: Conference Paper
    Author : Marda, Nikhil; Vaishnav, Gowtham; Rao, U.S.N.
    Publisher: IEEE
    Year: 2014

    Tunnel junction testbed based molecular devices 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    A new numerical simulation for stochastic transient stability analysis of power systems integrated wind power 

    Type: Conference Paper
    Author : Jiang, Changjiang; Zhao, Wei; Liu, Junyong; Liang, Wuxing; Masoud, Bazargan; Lu, Xiaohui; Luo, Tao; Meng, Tao
    Publisher: IEEE
    Year: 2014

    Classifying IDS alerts automatically for use in correlation systems 

    Type: Conference Paper
    Author : MirShahJafari, Mohammad; Ghavamnia, Hamed
    Publisher: IEEE
    Year: 2014

    An equivalent circuit for thick centered irises in rectangular waveguide 

    Type: Conference Paper
    Author : Zappelli, Leonardo
    Publisher: IEEE
    Year: 2014

    OpenFlow SDN testbed for Storage Area Network 

    Type: Conference Paper
    Author : Sadov, O.; Grudinin, V.; Shevel, A.; Vlasov, D.; Khoruzhnikov, S.; Titov, V.; Shkrebets, A.; Kairkanov, A.
    Publisher: IEEE
    Year: 2014

    The EXPRESS SDN experiment in the OpenLab large scale shared experimental Facility 

    Type: Conference Paper
    Author : Fdida, S.; Korakis, T.; Niavis, H.; Salsano, S.; Siracusano, G.
    Publisher: IEEE
    Year: 2014

    Dispersion characteristic a periodic substrate integrated waveguide of parallel metallic plates 

    Type: Conference Paper
    Author : Li, Xinru; Tzuang, Ching-Kuang C.; Wu, Hsien-Shun
    Publisher: IEEE
    Year: 2014
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