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Criticality of assumptions in the study of performance degradation caused by mode-dependent loss in SDM systems

Type: Conference Paper

Author : Antonelli, C.; Mecozzi, A.; Shtaif, M.; Winzer, P.J.

Publisher: IEEE

Year: 2014

Silicon knife-edge taper fiber coupler using CMOS backend compatible process

Type: Conference Paper

Author : Maegami, Yuriko; Takei, Ryohei; Omoda, Emiko; Sasaki, Mikiko; Ukita, Shigenari; Amano, Takeru; Okano, Makoto; Mori, Masahiko; Kamei, Toshihiro; Sakakibara, Youichi

Publisher: IEEE

Year: 2014

An improved evolution-constructed (iECO) features framework: Distribution statement A: Approved for public release; distribution is unlimited

Type: Conference Paper

Author : Price, Stanton R.; Anderson, Derek T.; Luke, Robert H.

Publisher: IEEE

Year: 2014

Content-based query for class-level tagged items via the EPC network

Type: Conference Paper

Author : Wang, Zhijun; Jiang, Keyuan; Du, Ming; Le, Jiajin

Publisher: IEEE

Year: 2014

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Criticality of assumptions in the study of performance degradation caused by mode-dependent loss in SDM systems

Silicon knife-edge taper fiber coupler using CMOS backend compatible process

An improved evolution-constructed (iECO) features framework: Distribution statement A: Approved for public release; distribution is unlimited

Content-based query for class-level tagged items via the EPC network

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Criticality of assumptions in the study of performance degradation caused by mode-dependent loss in SDM systems

Silicon knife-edge taper fiber coupler using CMOS backend compatible process

An improved evolution-constructed (iECO) features framework: Distribution statement A: Approved for public release; distribution is unlimited

Content-based query for class-level tagged items via the EPC network