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نمایش تعداد 1-6 از 6

Collimation Sensing With Differential Grating and Talbot Interferometry

نوع: Journal Paper

نویسنده : Nan Wang; Yan Tang; Wei Jiang; Wei Yan; Song Hu

ناشر: IEEE

سال: 2014

Automatic Measurement and Stress Analysis of ITO/PET Flexible Substrate by Shadow Moiré Interferometer With Phase-Shifting Interferometry

نوع: Journal Paper

نویسنده : Kuo-Ting Huang; Hsi-Chao Chen

ناشر: IEEE

سال: 2014

A Moiré-Based Four-Channel Focusing and Leveling Scheme for Projection Lithography

نوع: Journal Paper

نویسنده : Chengliang Di; Wei Yan; Song Hu; Yanli Li; Didi Yin; Yan Tang; Junmin Tong

ناشر: IEEE

سال: 2014

Human ear recognition using geometric features

نوع: Conference Paper

نویسنده : Rahman, M. , Sadi, M.S. , Islam, M.R.

ناشر: IEEE

سال: 2014

Influence of Collimation on Alignment Accuracy in Proximity Lithography

نوع: Journal Paper

نویسنده : Nan Wang; Wei Jiang; Jiangping Zhu; Yan Tang; Wei Yan; Junmin Tong; Song Hu

ناشر: IEEE

سال: 2014

Stress Analysis in a Si<sub>1-<italic>x</italic></sub>Ge<sub><italic>x</italic></sub>-Channel-Transistor by Scanning Moiré Fringe Imaging

نوع: Journal Paper

نویسنده : Suhyun Kim; Younheum Jung; Joong Jung Kim; Sunyoung Lee; Haebum Lee

ناشر: IEEE

سال: 2014

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Collimation Sensing With Differential Grating and Talbot Interferometry

Automatic Measurement and Stress Analysis of ITO/PET Flexible Substrate by Shadow Moiré Interferometer With Phase-Shifting Interferometry

A Moiré-Based Four-Channel Focusing and Leveling Scheme for Projection Lithography

Human ear recognition using geometric features

Influence of Collimation on Alignment Accuracy in Proximity Lithography

Stress Analysis in a Si<sub>1-<italic>x</italic></sub>Ge<sub><italic>x</italic></sub>-Channel-Transistor by Scanning Moiré Fringe Imaging

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Collimation Sensing With Differential Grating and Talbot Interferometry

Automatic Measurement and Stress Analysis of ITO/PET Flexible Substrate by Shadow Moir&#x00E9; Interferometer With Phase-Shifting Interferometry

A Moir&#x00E9;-Based Four-Channel Focusing and Leveling Scheme for Projection Lithography

Human ear recognition using geometric features

Influence of Collimation on Alignment Accuracy in Proximity Lithography

Stress Analysis in a Si<sub>1-<italic>x</italic></sub>Ge<sub><italic>x</italic></sub>-Channel-Transistor by Scanning Moir&#x00E9; Fringe Imaging

Automatic Measurement and Stress Analysis of ITO/PET Flexible Substrate by Shadow Moiré Interferometer With Phase-Shifting Interferometry

A Moiré-Based Four-Channel Focusing and Leveling Scheme for Projection Lithography

Stress Analysis in a Si<sub>1-<italic>x</italic></sub>Ge<sub><italic>x</italic></sub>-Channel-Transistor by Scanning Moiré Fringe Imaging