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نمایش تعداد 1-10 از 67
Test Compaction by Sharing of Transparent-Scan Sequences Among Logic Blocks
ناشر: IEEE
سال: 2014
Utilizing ATE Vector Repeat With Linear Decompressor for Test Vector Compression
ناشر: IEEE
سال: 2014
Study on WeChat User Behaviors of University Graduates
ناشر: IEEE
سال: 2014
COMeT+: Continuous Online Memory Testing with Multi-Threading Extension
ناشر: IEEE
سال: 2014
Reducing the input test data volume under transparent scan
ناشر: IET
سال: 2014
Silicon Odometers: Compact In Situ Aging Sensors for Robust System Design
ناشر: IEEE
سال: 2014