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Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

نوع: Journal Paper

نویسنده : Janicki, Jakub; Kassab, M.; Mrugalski, Grzegorz; Mukherjee, Nandini; Rajski, J.; Tyszer, J.

ناشر: IEEE

سال: 2014

Electrical localisation of full open defects in comb–meander–comb structures

نوع: Journal Paper

نویسنده : Arumí , D.; Rodrí guez-Montañ é s, R.; Figueras, Jaume

ناشر: IET

سال: 2014

Extracting product features from online reviews based on two-level HHMM

نوع: Conference Paper

نویسنده : Wang, Xiaoli; Lu, Zhang

ناشر: IEEE

سال: 2014

Self-Consistency and Consistency-Based Detection and Diagnosis of Malicious Circuitry

نوع: Journal Paper

نویسنده : Sheng Wei; Potkonjak, Miodrag

ناشر: IEEE

سال: 2014

Dynamic and Electrical Characteristics of Microprobe Testing in Microelectronics Packaging

نوع: Journal Paper

نویسنده : Junhui Li; Dasong Ge; Hu He; Lei Han

ناشر: IEEE

سال: 2014

Leakage and delay analysis in FinFET array multiplier circuits

نوع: Conference Paper

نویسنده : Whitehouse, Joseph , John, Eugene

ناشر: IEEE

سال: 2014

3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations

نوع: Journal Paper

نویسنده : Jaeyong Chung; Yonghyun Kim; Joon-Sung Yang

ناشر: IEEE

سال: 2014

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

نوع: Journal Paper

نویسنده : Kundu, Sandipan; Jha, Abhishek; Chattopadhyay, Subrata; Sengupta, Indranil; Kapur, R.

ناشر: IEEE

سال: 2014

Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress

نوع: Journal Paper

نویسنده : Hyoyoung Shin; Youngkyu Park; Gihwa Lee; Jungsik Park; Sungho Kang

ناشر: IEEE

سال: 2014

Street lighting control system based on large-scale WSN: A step towards a smart city

نوع: Conference Paper

نویسنده : Lavric, Alexandru; Popa, Valentin; Sfichi, Stefan

ناشر: IEEE

سال: 2014

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Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Electrical localisation of full open defects in comb–meander–comb structures

Extracting product features from online reviews based on two-level HHMM

Self-Consistency and Consistency-Based Detection and Diagnosis of Malicious Circuitry

Dynamic and Electrical Characteristics of Microprobe Testing in Microelectronics Packaging

Leakage and delay analysis in FinFET array multiplier circuits

3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress

Street lighting control system based on large-scale WSN: A step towards a smart city

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Erratum to &#x201C;Test Time Reduction in EDT Bandwidth Management for SoC Designs&#x201D; [Nov 13 1776-1786]

Electrical localisation of full open defects in comb&#8211;meander&#8211;comb structures

Extracting product features from online reviews based on two-level HHMM

Self-Consistency and Consistency-Based Detection and Diagnosis of Malicious Circuitry

Dynamic and Electrical Characteristics of Microprobe Testing in Microelectronics Packaging

Leakage and delay analysis in FinFET array multiplier circuits

3-D Probe: Low-Cost Variation Modeling Using Intertest-Item Correlations

Framework for Multiple-Fault Diagnosis Based on Multiple Fault Simulation Using Particle Swarm Optimization

Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress

Street lighting control system based on large-scale WSN: A step towards a smart city

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Electrical localisation of full open defects in comb–meander–comb structures