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Degradations of Threshold Voltage, Mobility, and Drain Current and the Dependence on Transistor Geometry For Stressing at 77 K and 300 K

Type: Journal Paper

Author : Guoying Wu; Deptuch, Grzegorz W.; Hoff, Jim R.; Ping Gui

Publisher: IEEE

Year: 2014

AlN/AlGaN HEMTs on AlN substrate for stable high-temperature operation

Type: Journal Paper

Author : Yafune, N.; Hashimoto, Shuji; Akita, K.; Yamamoto, Yusaku; Tokuda, Hirokuni; Kuzuhara, Masaaki

Publisher: IET

Year: 2014

Linear Drain Current Degradation of FG-pLEDMOS Transistor Under Pulse Gate Stress With Different Rising and Falling Edges

Type: Journal Paper

Author : Qinsong Qian; Tingting Huang; Siyang Liu; Weifeng Sun; Wei Su; Aijun Zhang; Shaorong Wang; Shulang Ma

Publisher: IEEE

Year: 2014

Systematic layout planning in human-sytem interface An evaluation of alarm displays with spatial proximity for accidents diagnosis of advanced nuclear power plant

Type: Conference Paper

Author : Kang-Hung Liu , Sheue-Ling Hwang

Publisher: IEEE

Year: 2014

Substrate-Coupled Cross-Talk Effects on an AlGaN/GaN-on-Si Smart Power IC Platform

Type: Journal Paper

Author : Qimeng Jiang; Zhikai Tang; Chunhua Zhou; Shu Yang; Chen, Kevin J.

Publisher: IEEE

Year: 2014

Author

Aijun Zhang (1)

Akita, K. (1)

Chen, Kevin J. (1)

Chunhua Zhou (1)

Deptuch, Grzegorz W. (1)

Guoying Wu (1)

Hashimoto, Shuji (1)

Hoff, Jim R. (1)

Kang-Hung Liu , Sheue-Ling Hwang (1)

Kuzuhara, Masaaki (1)

Publisher

IEEE (4)

IET (1)

Year

2014 (5)

Keywords

drain current degradation (3)

gallium compounds (3)

III-V semiconductors (3)

wide band gap semiconductors (3)

aluminium compounds (2)

CMOS integrated circuits (2)

Degradation (2)

MOSFET (2)

Stress (2)

2DEG channel (1)

Type

Journal Paper (4)

Conference Paper (1)

Language (ISO)

English (5)

Content Type

Metadata Only (5)

Publication Title

Device and Materials Reliability, IEEE Transactions on (2)

Electron Devices, IEEE Transactions on (1)

Electronics Letters (1)

omputer Supported Cooperative Work in Design (CSCWD), Proceedings of the 2014 IEEE 18th Internationa (1)

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