Search

نمایش تعداد 1-6 از 6

Thermally Excited Mag-Noise in Ferromagnetic Ring Structures

نوع: Journal Paper

نویسنده : Zeng, Tao; Zhou, Yangzhong; Lin, Kawuu W.; Lai, P.T.; Pong, Philip W. T.

ناشر: IEEE

سال: 2014

A Neuronal Signal Detector for Biologically Generated Magnetic Fields

نوع: Journal Paper

نویسنده : Costa, Tiago; Piedade, Moises S.; Germano, Jose; Amaral, Jose; Freitas, P.P.

ناشر: IEEE

سال: 2014

Evolving Gaussian process models for predicting chaotic time-series

نوع: Conference Paper

نویسنده : Petelin, Dejan , Kocijan, Jus

ناشر: IEEE

سال: 2014

Single-Cycle-PLL Detection for Real-Time FM-AFM Applications

نوع: Journal Paper

نویسنده : Schlecker, Benedikt; Dukic, Maja; Erickson, Blake; Ortmanns, Maurits; Fantner, Georg; Anders, Jens

ناشر: IEEE

سال: 2014

Sampling Circuits That Break the kT/C Thermal Noise Limit

نوع: Journal Paper

نویسنده : Kapusta, R.; Haiyang Zhu; Lyden, Colin

ناشر: IEEE

سال: 2014

Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer

نوع: Journal Paper

نویسنده : Sang-Hyun Lee; Ye-Ram Kim; Jae-Ho Hong; Eui-Young Jeong; Jun-Sik Yoon; Chang-Ki Baek; Dong-Won Kim; Jeong-Soo Lee; Yoon-Ha Jeong

ناشر: IEEE

سال: 2014

Search

Thermally Excited Mag-Noise in Ferromagnetic Ring Structures

A Neuronal Signal Detector for Biologically Generated Magnetic Fields

Evolving Gaussian process models for predicting chaotic time-series

Single-Cycle-PLL Detection for Real-Time FM-AFM Applications

Sampling Circuits That Break the kT/C Thermal Noise Limit

Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer

نویسنده

ناشر

سال

کلیدواژه

نوع

زبان

نوع محتوا

عنوان ناشر

Search

Filters

Thermally Excited Mag-Noise in Ferromagnetic Ring Structures

A Neuronal Signal Detector for Biologically Generated Magnetic Fields

Evolving Gaussian process models for predicting chaotic time-series

Single-Cycle-PLL Detection for Real-Time FM-AFM Applications

Sampling Circuits That Break the kT/C Thermal Noise Limit

Investigation of Low-Frequency Noise in p-type Nanowire FETs: Effect of Switched Biasing Condition and Embedded SiGe Layer