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نمایش تعداد 1-10 از 10

Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests

نوع: Journal Paper

نویسنده : Pomeranz, Irith

ناشر: IEEE

سال: 2014

Utilizing Circuit Structure for Scan Chain Diagnosis

نوع: Journal Paper

نویسنده : Wei-Hen Lo; Ang-Chih Hsieh; Chien-Ming Lan; Min-Hsien Lin; TingTing Hwang

ناشر: IEEE

سال: 2014

Program Committee and Steering Committee

نوع: Conference Paper

ناشر: IEEE

سال: 2014

Considerations in the design of a boundary scan runtime library

نوع: Journal Paper

نویسنده : Borroz, Terry

ناشر: IEEE

سال: 2014

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

نوع: Journal Paper

نویسنده : Ran Wang; Chakrabarty, Krishnendu; Eklow, Bill

ناشر: IEEE

سال: 2014

Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States

نوع: Journal Paper

نویسنده : Pomeranz, Irith

ناشر: IEEE

سال: 2014

Pulse-Vanishing Test for Interposers Wires in 2.5-D IC

نوع: Journal Paper

نویسنده : Shi-Yu Huang; Jeo-Yen Lee; Kun-Han Tsai; Wu-Tung Cheng

ناشر: IEEE

سال: 2014

[Copyright notice]

نوع: Conference Paper

ناشر: IEEE

سال: 2014

A questionnaire for the evaluation of self-regulated learning support in software

نوع: Conference Paper

نویسنده : Manso-Vazquez, M.; Caeiro-Rodriguez, M.; Llamas-Nistal, M.

ناشر: IEEE

سال: 2014

Research of hysteresis loss in large dry submersible motor with the fault of static eccentricity

نوع: Conference Paper

نویسنده : Na Liang; Xiaowei Cheng; Yong Fang; Fuying Li; Qiang Lv; Xiaohua Bao

ناشر: IEEE

سال: 2014

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Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests

Utilizing Circuit Structure for Scan Chain Diagnosis

Program Committee and Steering Committee

Considerations in the design of a boundary scan runtime library

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States

Pulse-Vanishing Test for Interposers Wires in 2.5-D IC

[Copyright notice]

A questionnaire for the evaluation of self-regulated learning support in software

Research of hysteresis loss in large dry submersible motor with the fault of static eccentricity

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Static Test Compaction for Scan Circuits by Using Restoration to Modify and Remove Tests

Utilizing Circuit Structure for Scan Chain Diagnosis

Program Committee and Steering Committee

Considerations in the design of a boundary scan runtime library

Scan-Based Testing of Post-Bond Silicon Interposer Interconnects in 2.5-D ICs

Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States

Pulse-Vanishing Test for Interposers Wires in 2.5-D IC

[Copyright notice]

A questionnaire for the evaluation of self-regulated learning support in software

Research of hysteresis loss in large dry submersible motor with the fault of static eccentricity