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    Global sensitivity and uncertainty analysis of Transients in the Universal Line Model 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Characterization of High Power Microwave Radiation by an Axially Extracted Vircator 

    Type: Journal Paper
    Author : Verma, Rajesh; Shukla, Rohit; Sharma, Sanjay Kumar; Banerjee, Prithu; Das, Ratan; Deb, P.; Prabaharan, T.; Das, Biswajit; Mishra, E.; Adhikary, B.; Sagar, Kalpna; Meena, M.; Shyam, A.
    Publisher: IEEE
    Year: 2014

    Electrical Circuit Modeling for Efficiency Improvement of Axial Virtual Cathode Oscillator 

    Type: Journal Paper
    Author : Kun-A Lee; Kwang-Cheol Ko
    Publisher: IEEE
    Year: 2014

    Legal aspects of CCTV data de-identification 

    Type: Conference Paper
    Author : Pastukhov, O.
    Publisher: IEEE
    Year: 2014

    Fairness-Based Dynamic Sub-carrier Assignment for Real Time Services in OFDMA Networks 

    Type: Conference Paper
    Author : Rodrigues, Emanuel B. , Casadevall, Fernando
    Publisher: IEEE
    Year: 2014

    Assessing network compliance for power quality performance 

    Type: Conference Paper
    Publisher: IEEE
    Year: 2014

    Optimal Training in Continuous Flat-Fading Massive MIMO Systems 

    Type: Conference Paper
    Author : Truong, Kien T. , Lozano, Angel , Heath, Robert W.
    Publisher: IEEE
    Year: 2014

    Imaging of Explosive Emission Cathode and Anode Plasma in a Vacuum-Sealed Vircator High-Power Microwave Source at 250 A/cm<sup>2</sup> 

    Type: Journal Paper
    Author : Parson, Jonathan M.; Mankowski, John J.; Dickens, James C.; Neuber, Andreas /A/.
    Publisher: IEEE
    Year: 2014

    Modeling of Reflex Triode Virtual Cathode Oscillator 

    Type: Journal Paper
    Author : Saxena, Ankur; Singh, N.M.; Shambharkar, Kunal Y.; Kazi, Faruk
    Publisher: IEEE
    Year: 2014

    Algorithm for relative location of voltage sags and capacitor switching transients based on voltage measurements only 

    Type: Conference Paper
    Author : Blanco, J. , Petit, J.F. , Ordonez, G.
    Publisher: IEEE
    Year: 2014
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