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    Effect of Substrate Temperature on Roughness, Thickness and Optical Properties of ZnS Thin Films 

    Type: Conference Paper
    Author : S, Nikbin; G., Kavei; K., Ahmadi

    Optical studies of pulsed laser deposited nanostructured Pb(Zr 0.52Ti0.48)O3 thin film by spectroscopic ellipsometry 

    Type: Journal Paper
    Publisher: American Scientific Publishers
    Year: 2014

    High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics 

    Type: Journal Paper
    Author : Shan, Ambalanath; Fried, Miklos; Juhasz, Gyorgy; Major, Csaba; Polgar, Oliver; Nemeth, A.; Petrik, Peter; Dahal, L.R.; Jie Chen; Zhiquan Huang; Podraza, Nikolas J.; Collins, Robert W.
    Publisher: IEEE
    Year: 2014

    Design of energy management system for Active Distribution Network 

    Type: Conference Paper
    Author : Liu, Guangyi; Huang, Renle; Pu, Tianjiao; Yang, Zhanyong
    Publisher: IEEE
    Year: 2014

    Heterogeneous link prediction based on multi relational community information 

    Type: Conference Paper
    Author : Lakshmi, T.J. , Bhavani, S.D.
    Year: 2014

    Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In <formula formulatype="inline"> <img src="/images/tex/21173.gif" alt="_{{\\bf 1}-{bm x}}"> </formula>Ga<formula formulatype="inline"> <img src="/images/tex/20922.gif" alt="_{bm x}"> </formula>)Se<formula formulatype="inline"> <img src="/images/tex/996.gif" alt="_{\\bf 2}"> < 

    Type: Journal Paper
    Author : Aryal, Puruswottam; Pradhan, Parth; Attygalle, Dinesh; Ibdah, Abdel-Rahman /A/.; Aryal, Krishna; Ranjan, Viresh; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.
    Publisher: IEEE
    Year: 2014

    Analytical Modeling of Sub-onset Current of Tunnel Field Effect Transistor 

    Type: Conference Paper
    Year: 2014

    Applying a user-centered, rapid-prototyping methodology with quantified self: A case study with triathletes 

    Type: Conference Paper
    Author : De Croon, Robin; De Buyser, Tom; Klerkx, Joris; Duval, Erik
    Publisher: IEEE
    Year: 2014

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