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نمایش تعداد 1-10 از 36
Process bus reliability analysis
ناشر: IEEE
سال: 2014
TE-absorption profile in plasmonic-capped Sic nanorods under Otto configuration
ناشر: IEEE
سال: 2014
Tools for External Plagiarism Detection in DOCODE
ناشر: IEEE
سال: 2014
Applicability of power-gating strategies for aging mitigation of CMOS logic paths
ناشر: IEEE
سال: 2014
Data-Driven Blended Problem Based Learning Towards Enhancing Transversal Skills
ناشر: IEEE
سال: 2014
Secure successive refinement with degraded side information
ناشر: IEEE
سال: 2014
Delivery quality score model for Internet video
ناشر: IEEE
سال: 2014