Search
نمایش تعداد 1-10 از 11
Body-bias effect in SOI FinFET for low-power applications: Gate length dependence
ناشر: IEEE
سال: 2014
Using Accelerated Life Testing techniques for preventive maintenance scheduling
ناشر: IEEE
سال: 2014
Semi-supervised sparse coding
ناشر: IEEE
سال: 2014
ICECE 2014 technical program
ناشر: IEEE
سال: 2014
Table of contents
ناشر: IEEE
سال: 2014