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نمایش تعداد 1-10 از 61
Analytical averaged loss model of a three-level T-type converter
ناشر: IEEE
سال: 2014
Testing of TSV-Induced Small Delay Faults for 3-D Integrated Circuits
ناشر: IEEE
سال: 2014
FBI Measurement Facility for High Temperature Superconducting Cable Designs
ناشر: IEEE
سال: 2014