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On the Automatic Generation of Optimized Software-Based Self-Test Programs for VLIW Processors

Type: Journal Paper

Author : Sabena, D.; Reorda, M. Sonza; Sterpone, L.

Publisher: IEEE

Year: 2014

Soft error effects analysis and mitigation in VLIW safety-critical applications

Type: Conference Paper

Author : Sabena, D.; Reorda, M.Sonza; Sterpone, L.

Publisher: IEEE

Year: 2014

MIHST: A Hardware Technique for Embedded Microprocessor Functional On-Line Self-Test

Type: Journal Paper

Author : Bernardi, P.; Ciganda, Lyl Mercedes; Sanchez, E.; Reorda, M. Sonza

Publisher: IEEE

Year: 2014

Author

Reorda, M. Sonza (2)

Sabena, D. (2)

Sterpone, L. (2)

Bernardi, P. (1)

Ciganda, Lyl Mercedes (1)

Reorda, M.Sonza (1)

Sanchez, E. (1)

Publisher

IEEE (3)

Year

2014 (3)

Keywords

microprocessor chips (2)

automatic testing (1)

BIST (1)

built-in self test (1)

Built-in self-test (1)

cryptography (1)

electronic engineering computing (1)

embedded microprocessor (1)

embedded signal processing applications (1)

Embedded systems (1)

Type

Journal Paper (2)

Conference Paper (1)

Language (ISO)

English (3)

Content Type

Metadata Only (3)

Publication Title

Computers, IEEE Transactions on (1)

ery Large Scale Integration (VLSI-SoC), 2014 22nd International Conference on (1)

Very Large Scale Integration (VLSI) Systems, IEEE Transactions on (1)

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