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New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

Type: Journal Paper

Author : Martin-Martinez, J.; Diaz, J.; Rodriguez, Roberto; Nafria, M.; Aymerich, X.

Publisher: IEEE

Year: 2014

TCAD simulation of interface traps related variability in bulk decananometer mosfets

Type: Conference Paper

Author : Velayudhan, V.; Martin-Martinez, J.; Rodriguez, R.; Porti, M.; Nafria, M.; Aymerich, X.; Medina, C.; Gamiz, F.

Publisher: IEEE

Year: 2014

Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers

Type: Conference Paper

Author : Martin-Martinez, J.; Diaz, J.; Rodriguez, R.; Nafria, M.; Aymerich, X.; Roca, E.; Fernandez, F.V.; Rubio, A.

Publisher: IEEE

Year: 2014

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

Type: Journal Paper

Author : Qian Wu; Bayerl, A.; Porti, M.; Martin-Martinez, J.; Lanza, Mario; Rodriguez, Roberto; Velayudhan, V.; Nafria, M.; Aymerich, X.; Bargallo Gonzalez, Mireia; Simoen, Eddy

Publisher: IEEE

Year: 2014

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New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

TCAD simulation of interface traps related variability in bulk decananometer mosfets

Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs

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New Weighted Time Lag Method for the Analysis of Random Telegraph Signals

TCAD simulation of interface traps related variability in bulk decananometer mosfets

Characterization of random telegraph noise and its impact on reliability of SRAM sense amplifiers

A Conductive AFM Nanoscale Analysis of NBTI and Channel Hot-Carrier Degradation in MOSFETs