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Measurement and Analysis of Alpha-Particle-Induced Soft Errors and Multiple Cell Upsets in 10T Subthreshold SRAM

Type: Journal Paper

Author : Fuketa, H.; Harada, R.; Hashimoto, M.; Onoye, T.

Publisher: IEEE

Year: 2013

An 85-mV input, 50-µs startup fully integrated voltage multiplier with passive clock boost using on-chip transformers for energy harvesting

Type: Conference Paper

Author : Fuketa, H.; Momiyama, Y.; Okamoto, A.; Sakata, T.; Takamiya, M.; Sakurai, T.

Publisher: IEEE

Year: 2014

Author

Fuketa, H. (2)

Harada, R. (1)

Hashimoto, M. (1)

Momiyama, Y. (1)

Okamoto, A. (1)

Onoye, T. (1)

Sakata, T. (1)

Sakurai, T. (1)

Takamiya, M. (1)

Publisher

IEEE (2)

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2014 (1)

2013 (1)

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Arrays (1)

Epitaxial growth (1)

Indium phosphide (1)

MOCVD (1)

Nanoscale devices (1)

nanowire (1)

Photovoltaic cells (1)

Scanning electron microscopy (1)

selective area epitaxy (1)

solar cell (1)

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Conference Paper (1)

Journal Paper (1)

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English (2)

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IEEE Transactions on Device and Materials Reliability (1)

uropean Solid State Circuits Conference (ESSCIRC), ESSCIRC 2014 - 40th (1)

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