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Now showing items 1-7 of 7
Electrical Noise in Heterojunction Interband Tunnel FETs
Publisher: IEEE
Year: 2014
Soft-Error Performance Evaluation on Emerging Low Power Devices
Publisher: IEEE
Year: 2014
Charge-Resistance Approach to Benchmarking Performance of Beyond-CMOS Information Processing Devices
Publisher: IEEE
Year: 2014
Impact of Single Trap Random Telegraph Noise on Heterojunction TFET SRAM Stability
Publisher: IEEE
Year: 2014
Equivalent Circuit of a Piezomagnetic Unimorph Incorporating Single-Crystal Galfenol
Publisher: IEEE
Year: 2014