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Electromigration simulation at circuit levels

Type: Conference Paper

Author : Cher Ming Tan

Publisher: IEEE

Year: 2014

Electromigration Modeling at Circuit Layout Level

Type: Ebook

Author : Cher Ming Tan; Feifei He

Publisher: Springer

Year: 2013

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Electromigration Modeling at Circuit Layout Level

Type: Ebook

Author : Cher Ming Tan; Feifei He

Publisher: Springer

Year: 2013

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Solubility, dispersion and bonding of functionalised carbon nanotubes in epoxy resins

Type: Journal Paper

Author : Baudot, Charles, and Cher Ming Tan.

Publisher: Inderscience Publishers

Year: 2009

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Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

Type: Journal Paper

Author : Cher Ming Tan; Nagarajan Raghavan

Year: 2010

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Effect of IC layout on the reliability of CMOS amplifiers

Type: Journal Paper

Author : Feifei He; Cher Ming Tan

Year: 2012

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Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

Type: Journal Paper

Author : Song Lan; Cher Ming Tan

Year: 2014

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Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test

Type: Conference Paper

Author : Cher Ming Tan; Narula, U.

Publisher: IEEE

Year: 2014

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Type: Journal Paper

Author : Cher Ming Tan; Singh, Prashant

Publisher: IEEE

Year: 2014

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

Type: Journal Paper

Author : Song Lan; Cher Ming Tan

Publisher: IEEE

Year: 2014

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Electromigration simulation at circuit levels

Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

Solubility, dispersion and bonding of functionalised carbon nanotubes in epoxy resins

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

Effect of IC layout on the reliability of CMOS amplifiers

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

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Electromigration simulation at circuit levels

Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

Solubility, dispersion and bonding of functionalised carbon nanotubes in epoxy resins

Imperfect predictive maintenance model for multi-state systems with multiple failure modes and element failure dependency

Effect of IC layout on the reliability of CMOS amplifiers

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction

Revisit resistance monitoring techniques for measuring TSV/Solder resistance during Electromigration test

Time Evolution Degradation Physics in High Power White LEDs Under High Temperature-Humidity Conditions

Degradation Model of a Linear-Mode LED Driver and its Application in Lifetime Prediction