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Breaking the Code of DNA Binding Specificity of TAL-Type III Effectors

Type: Journal Paper

Author : Boch, J.; Scholze, H.; Schornack, S.; Landgraf, A.; Hahn, S.; Kay, S.; Lahaye, T.; Nickstadt, A.; Bonas, U.

Year: 2009

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Study of a Thermal Annealing Approach for Very High Total Dose Environments

Type: Journal Paper

Author : Dhombres, S.; Michez, A.; Boch, J.; Saigne, F.; Beauvivre, S.; Kraehenbuehl, D.; Vaille, J.-R.; Adell, P.C.; Lorfevre, E.; Ecoffet, R.; Roig, Fabien

Publisher: IEEE

Year: 2014

Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier

Type: Journal Paper

Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaille, J.-R.; Boch, J.; Saigne, F.; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno

Publisher: IEEE

Year: 2014

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Type: Journal Paper

Publisher: IEEE

Year: 2014

Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier

Type: Journal Paper

Author : Roig, Fabien; Dusseau, L.; Ribeiro, P.; Auriel, G.; Roche, Nicholas J.-H; Privat, A.; Vaillé , J.-R.; Boch, J.; Saigné , Fré dé ric; Marec, R.; Calvel, P.; Bezerra, F.; Ecoffet, R.; Azais, Bruno

Publisher: IEEE

Year: 2014

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Breaking the Code of DNA Binding Specificity of TAL-Type III Effectors

Study of a Thermal Annealing Approach for Very High Total Dose Environments

Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier

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Breaking the Code of DNA Binding Specificity of TAL-Type III Effectors

Study of a Thermal Annealing Approach for Very High Total Dose Environments

Impact of Neutron-Induced Displacement Damage<newline/> on the ATREE Response in LM124 <newline/>Operational Amplifier

The Role of Feedback Resistors and TID Effects in the ASET Response of a High Speed Current Feedback Amplifier

Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier