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A Constrained Layout Placement Approach to Enhance Pulse Quenching Effect in Large Combinational Circuits

Type: Journal Paper

Author : Yankang Du; Shuming Chen; Biwei Liu

Publisher: IEEE

Year: 2014

An On-Line Control Flow Checking Method for VLIW Processor

Type: Journal Paper

Author : Shuming Chen; Xiao Hu; Biwei Liu; Jihua Chen

Year: 2007

Calculating the Soft Error Vulnerabilities of Combinational Circuits by Re-Considering the Sensitive Area

Type: Journal Paper

Author : Shuming Chen; Yankang Du; Biwei Liu; Junrui Qin

Publisher: IEEE

Year: 2014

Single-Event Pulse Broadening After Narrowing Effect in Nano-CMOS Logic Circuits

Type: Journal Paper

Author : Pengcheng Huang; Shuming Chen; Jianjun Chen; Bin Liang; Biwei Liu

Publisher: IEEE

Year: 2014

Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

Type: Journal Paper

Author : Junrui Qin; Shuming Chen; Bin Liang; Zhen Ge; Yibai He; Yankang Du; Biwei Liu; Jianjun Chen; Dawei Li

Year: 2014

Author

Biwei Liu (5)

Shuming Chen (5)

Yankang Du (3)

Bin Liang (2)

Jianjun Chen (2)

Junrui Qin (2)

Dawei Li (1)

Jihua Chen (1)

Pengcheng Huang (1)

Xiao Hu (1)

Publisher

IEEE (3)

Year

2014 (4)

2007 (1)

Keywords

radiation hardening (electronics) (3)

Combinational circuits (2)

combinational circuits (2)

Inverters (2)

Ions (2)

Layout (2)

Logic gates (2)

MOSFET (2)

SET (2)

single event transient (2)

Type

Journal Paper (5)

Language (ISO)

English (5)

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Metadata Only (3)

Fulltext (2)

Publication Title

Device and Materials Reliability, IEEE Transactions on (2)

13th Pacific Rim International Symposium on Dependable Computing (PRDC 2007) (1)

IEEE Transactions on Device and Materials Reliability (1)

Nuclear Science, IEEE Transactions on (1)

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