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Mirage: A New Proton Facility for the Study of Direct Ionization in Sub-100nm Technologies
Publisher: IEEE
Year: 2014
Heavy Ion SEU Cross Section Calculation Based on Proton Experimental Data, and Vice Versa
Publisher: IEEE
Year: 2014
Experimental Characterization and Simulation of Electron-Induced SEU in 45-nm CMOS Technology
Publisher: IEEE
Year: 2014
On the Use of Post-Irradiation-Gate-Stress Results to Refine Sensitive Operating Area Determination
Publisher: IEEE
Year: 2014
Study and Modeling of the Impact of TID on the ATREE Response in LM124 Operational Amplifier
Publisher: IEEE
Year: 2014