Search
Now showing items 1-6 of 6
Random-Walk Drift-Diffusion Charge-Collection Model For Reverse-Biased Junctions Embedded in Circuits
Publisher: IEEE
Year: 2014
Application of the TIARA Radiation Transport Tool to Single Event Effects Simulation
Publisher: IEEE
Year: 2014
90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica
Publisher: IEEE
Year: 2014
An Analytical Model to Quantify Decay Chain Disequilibrium–Application to the Thorium Decay Chain
Publisher: IEEE
Year: 2014