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Near-Field Scanning Microwave Microscopy: An Emerging Research Tool for Nanoscale Metrology

Type: Journal Paper

Author : Imtiaz, Al; Wallis, T.M.; Kabos, P.

Publisher: IEEE

Year: 2014

Wireless Backhaul in Small Cell Networks: Modelling and Analysis

Type: Conference Paper

Author : Chen, Daniel C.; Quek, Tony Q.S.; Kountouris, Marios

Publisher: IEEE

Year: 2014

Author

Chen, Daniel C. (1)

Imtiaz, Al (1)

Kabos, P. (1)

Kountouris, Marios (1)

Quek, Tony Q.S. (1)

Wallis, T.M. (1)

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IEEE (2)

Year

2014 (2)

Keywords

AFM (1)

atomic force microscope (1)

atomic force microscopy (1)

atomic-scale device (1)

atomic-scale manipulation (1)

dielectric properties (1)

DNA (1)

DNA molecules (1)

Frequency (1)

molecular-scale device (1)

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Conference Paper (1)

Journal Paper (1)

Language (ISO)

English (2)

Content Type

Metadata Only (2)

Publication Title

ehicular Technology Conference (VTC Spring), 2014 IEEE 79th (1)

Microwave Magazine, IEEE (1)

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