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    Security risk modelling using SecureUML 

    Type: Conference Paper
    Author : Chowdhury, Mohammad Jabed Morshed
    Publisher: IEEE
    Year: 2014

    Status of WAM, ADS-B out and ATSAW deployment in Europe 

    Type: Conference Paper
    Author : Rekkas, C.
    Publisher: IEEE
    Year: 2014

    Development of carrier-phase synchronization swapper for space-division multiplexed self-homodyne optical networks 

    Type: Conference Paper
    Author : Sakaguchi, Jun; Awaji, Yoshinari; Wada, Naoya
    Publisher: IEEE
    Year: 2014

    M-ary phase shift keying receiver beating the standard quantum limit for any signal power 

    Type: Conference Paper
    Author : Muller, Christian R.; Leven, Andreas; Bulow, Henning; Schmalen, Laurent; Leuchs, Gerd; Marquardt, Christoph
    Publisher: IEEE
    Year: 2014

    Long-term features of quartz pressure gauges inferred from experimental and in-situ observations 

    Type: Conference Paper
    Author : Matsumoto, H.; Araki, E.; Kawaguchi, K.; Nishida, S.; Kaneda, Y.
    Publisher: IEEE
    Year: 2014

    System-on-chip processor using different FPGA architectures in the VTR CAD flow 

    Type: Conference Paper
    Author : Li, J.; Nasartschuk, K.; Kent, K.B.
    Publisher: IEEE
    Year: 2014

    AC interference assessment and impact on personnel safety 

    Type: Conference Paper
    Author : Purcar, Marius; Munteanu, Calin; Bortels, Leslie; Baete, Christophe
    Publisher: IEEE
    Year: 2014

    An improved tomographic approach for accurate target reconstruction from GPR numerical data 

    Type: Conference Paper
    Author : Comite, D.; Galli, A.; Catapano, I.; Soldovieri, F.; Pettinelli, E.
    Publisher: IEEE
    Year: 2014

    Prognostic modeling of transformer aging using Bayesian particle filtering 

    Type: Conference Paper
    Author : Catterson, V.M.
    Publisher: IEEE
    Year: 2014

    Linear surface interpolation for salt-and-pepper noise removal 

    Type: Conference Paper
    Author : Pahlavani, Farzad; Nabaee, Mojtaba
    Publisher: IEEE
    Year: 2014
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