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On fuzzy expert system development using computer-aided software engineering tools

Type: Conference Paper

Author : Polkovnikova, N.A.; Kureichik, V.M.

Publisher: IEEE

Year: 2014

University-industry research collaboration

Type: Conference Paper

Author : Karmakar, Nemai Chandra

Publisher: IEEE

Year: 2014

Oral session, Wed 10 December 2014 — 14:00–15:40

Type: Conference Paper

Publisher: IEEE

Year: 2014

Comparative study of AC breakdown voltage for various polymers: Influence of electrodes shape, thermal and hydrothermal ageing

Type: Conference Paper

Author : Douar, M.A.; Beroual, A.; Souche, X.

Publisher: IEEE

Year: 2014

A built-in self-test circuit for jitter tolerance measurement in high-speed wireline receivers

Type: Conference Paper

Author : Park, Myeong-Jae; Kim, Jaeha

Publisher: IEEE

Year: 2014

Tossing NoSQL-Databases Out to Public Clouds

Type: Conference Paper

Author : Antoniadis, Alexandros; Gerbessiotis, Yannis; Roussopoulos, Mema; Delis, Alex

Publisher: IEEE

Year: 2014

Simulation analysis of the Control Point Policy for semiconductor fab lines producing multiple part types

Type: Conference Paper

Author : Liaqat, T.; Young Jae Jang

Publisher: IEEE

Year: 2014

Towards adequate qualification testing of electronic products: Review and extension

Type: Conference Paper

Author : Khatibi, G.; Czerny, B.; Magnien, J.; Lederer, M.; Suhir, E.; Nicolics, J.

Publisher: IEEE

Year: 2014

New nano size filled TIM material with high thermally conductive properties

Type: Conference Paper

Author : Moscicki, A; Falat, T.; Kinart, A.; Smolarek, A.; Merten, E.

Publisher: IEEE

Year: 2014

Testing of transport system management strategy

Type: Conference Paper

Author : Lupin, Sergey; Shein, Than; Lin, Kyaw Kyaw; Davydova, Anastasia

Publisher: IEEE

Year: 2014

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On fuzzy expert system development using computer-aided software engineering tools

University-industry research collaboration

Oral session, Wed 10 December 2014 — 14:00–15:40

Comparative study of AC breakdown voltage for various polymers: Influence of electrodes shape, thermal and hydrothermal ageing

A built-in self-test circuit for jitter tolerance measurement in high-speed wireline receivers

Tossing NoSQL-Databases Out to Public Clouds

Simulation analysis of the Control Point Policy for semiconductor fab lines producing multiple part types

Towards adequate qualification testing of electronic products: Review and extension

New nano size filled TIM material with high thermally conductive properties

Testing of transport system management strategy

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On fuzzy expert system development using computer-aided software engineering tools

University-industry research collaboration

Oral session, Wed 10 December 2014 &#x2014; 14:00&#x2013;15:40

Comparative study of AC breakdown voltage for various polymers: Influence of electrodes shape, thermal and hydrothermal ageing

A built-in self-test circuit for jitter tolerance measurement in high-speed wireline receivers

Tossing NoSQL-Databases Out to Public Clouds

Simulation analysis of the Control Point Policy for semiconductor fab lines producing multiple part types

Towards adequate qualification testing of electronic products: Review and extension

New nano size filled TIM material with high thermally conductive properties

Testing of transport system management strategy

Oral session, Wed 10 December 2014 — 14:00–15:40