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An Alternative Positioning Navigation and Timing concept based on Diverse Ranging

Type: Conference Paper

Author : Wu, R.H. , Davidson, S.A.

Publisher: IEEE

Year: 2014

COMeT+: Continuous Online Memory Testing with Multi-Threading Extension

Type: Journal Paper

Author : Rahman, Mosaddequr; Childers, Bruce R.; Sangyeun Cho

Publisher: IEEE

Year: 2014

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

Type: Journal Paper

Author : Sanguhn Cha; Hongil Yoon

Publisher: IEEE

Year: 2014

On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories

Type: Journal Paper

Author : Covi, E.; Cabrini, Alessandro; Vendrame, L.; Bortesi, L.; Gastaldi, R.; Torelli, Guido

Publisher: IEEE

Year: 2014

Research on Prosody for Chinese Sign Language Synthesis

Type: Conference Paper

Author : Jinghua, Li; Baocai, Yin; Lichun, Wang; Dehui, Kong; Wentong, Wang

Publisher: IEEE

Year: 2014

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

Type: Journal Paper

Author : Tsiligiannis, G.; Dilillo, L.; Bosio, A.; Girard, P.; Pravossoudovitch, S.; Virazel, A.; Cocquerez, P.; Autran, J.L.; Litterio, A.; Wrobel, F.; Saigne, F.

Publisher: IEEE

Year: 2014

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An Alternative Positioning Navigation and Timing concept based on Diverse Ranging

COMeT+: Continuous Online Memory Testing with Multi-Threading Extension

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories

Research on Prosody for Chinese Sign Language Synthesis

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

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An Alternative Positioning Navigation and Timing concept based on Diverse Ranging

COMeT&#x002B;: Continuous Online Memory Testing with Multi-Threading Extension

Single-Error-Correction and Double-Adjacent-Error-Correction Code for Simultaneous Testing of Data Bit and Check Bit Arrays in Memories

On-Wafer Analog Pulse Generator for Fast Characterization and Parametric Test of Resistive Switching Memories

Research on Prosody for Chinese Sign Language Synthesis

90&#x00A0;nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica

COMeT+: Continuous Online Memory Testing with Multi-Threading Extension

90 nm SRAM Static and Dynamic Mode Real-Time Testing at Concordia Station in Antarctica