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Ultra wideband dual square trident planar antenna

Type: Conference Paper

Publisher: IEEE

Year: 2014

Reliability growth testing, what is the real final result? Accelerated test methodology for reliability growth

Type: Conference Paper

Author : Krasich, M.

Publisher: IEEE

Year: 2014

Reflectance measurements of triangular lattice GaAs nanowire arrays

Type: Conference Paper

Author : Kakko, Joona-Pekko; Haggren, Tuomas; Huhtio, Teppo; Dhaka, Veer; Lipsanen, Harri

Publisher: IEEE

Year: 2014

E-Learning Readiness: A Literature Review

Type: Conference Paper

Author : Hashim, H. , Tasir, Z.

Publisher: IEEE

Year: 2014

Author

Dhaka, Veer (1)

Haggren, Tuomas (1)

Hashim, H. , Tasir, Z. (1)

Huhtio, Teppo (1)

Kakko, Joona-Pekko (1)

Krasich, M. (1)

Lipsanen, Harri (1)

Publisher

IEEE (4)

Year

2014 (4)

Keywords

isolated load (2)

Voltage control (2)

angular velocity control (1)

Batteries (1)

bi-directional DC/DC converter (1)

Bidirectional control (1)

bidirectional DC DC converter (1)

Capacitance (1)

capacitance requirement (1)

Capacitors (1)

Type

Conference Paper (4)

Language (ISO)

English (4)

Content Type

Metadata Only (4)

Publication Title

anotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on (1)

eaching and Learning in Computing and Engineering (LaTiCE), 2014 International Conference on (1)

eliability and Maintainability Symposium (RAMS), 2014 Annual (1)

ntennas and Propagation Society International Symposium (APSURSI), 2014 IEEE (1)

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